High-performance Benchtop EDXRF with Small Spot Analysis
Key Advantages & Features
NEX DE VS is a high-performance, direct excitation energy dispersive X-ray fluorescence (EDXRF) spectrometer that provides rapid, non-destructive qualitative and quantitative elemental analysis of sodium (Na) to uranium (U) with small spot analysis capabilities. It is ideal for measuring low ppm levels up to high weight percent concentrations. NEX DE VS features a high-resolution camera and automated collimators to allow precise sample positioning to analyze 1 mm, 3 mm, and 10 mm spot sizes.
- Non-destructive analysis of sodium to uranium
- Powerful, easy-to-use QuantEZ software
- Integrated high-res camera with Point Analysis interface
- Analyze 1 mm, 3 mm, and 10 mm spot sizes
- Solids, liquids, alloys, powders, and films
- 60 kV 12 W X-ray tube for wide elemental coverage
- High-performance SDD for superior data
- Low cost of ownership backed by a 2-year warranty
- Optional RPF-SQX Fundamental Parameters software
Video
Additional Notes
Multi-position, Small Spot & Bulk Elemental Analysis
Analyze from bulk materials to small spots on finished products. The high-resolution camera and automated collimators allow the exact positioning of samples to analyze 1 mm, 3 mm, and 10 mm spot sizes. The backlit camera system also allows the sample’s image to be recorded. Additionally, the large sample chamber accommodates samples up to 30 cm in diameter and 10 cm tall, as well as various single-position and autosampler options. NEX DE VS is an excellent system for measuring coatings on smaller parts, screening small samples for electronic waste initiatives, or investigating the identification of foreign matter of unknown composition.
High-performance Elemental Analysis in the Field, Plant, or Lab
Whether on the plant floor or in a QC lab, NEX DE VS provides unparalleled bulk and small-spot analysis performance. The superior analytical power, flexibility, and ease of use add to its broad appeal for an ever-expanding range of applications, including exploration, research, bulk RoHS inspection, basic quality control (QC), or its more sophisticated variants, such as analytical quality control (AQC), quality assurance (QA), or statistical process control like Six Sigma.
60 kV X-ray Tube and SDD
The 60 kV X-ray tube and Peltier-cooled silicon drift detector (SDD) deliver exceptional short-term repeatability and long-term reproducibility with excellent element peak resolution. This high voltage capability (60 kV), high emission current, and multiple automated X-ray tube filters provide a wide range of XRF applications versatility and low limits-of-detection (LOD).
Optional Autosamplers, Helium, and Standardless FP
Options include fundamental parameters, a variety of automatic sample changers, a sample spinner, and a helium purge.
Contact us for more information about NEX DE VS.