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Silicone Coatings Analysis

EDXRF for Silicone Coat Weight Analysis

Si Coatings Analysis for Web Applications

At-line Solutions | In-line Solutions

Rigaku EDXRF elemental analyzers serve web applications, performing at-line silicone coat weight analysis or in-line silicone coat weight profiling.

Also, EDXRF, a common type of XRF (X-ray fluorescence), has long been a familiar technology for release coatings, converters, vacuum-formed plastics manufacturers, and other industries using silicone oils as barrier layers, release coatings, or denesting agents. XRF is a standard technique employed across the Si coatings industry to determine silicone coating thicknesses or coat weight, or elemental composition of a product. Additionally, EDXRF instruments are easy to use for Si coat weight analysis and offer a low cost of ownership.

Insufficient or excessive silicone application on paper and plastic substrates can significantly alter the release characteristics of a product, such as labels or packaging. Consequently, this can lead to manufacturing process disruptions and reduced profitability. To help with these challenges, Applied Rigaku Technologies offers high-quality elemental analyzers for reliable silicone coatings analysis — providing the control you need to optimize your processes.

NEX LS, an in-line silicone coatings analyzer, allows continuous monitoring without stopping production, and NEX QC Series offer at-line silicone coat weight analysis.

Our Guarantee

We offer a 2-year warranty on all EDXRF spectrometers we produce. This industry-leading manufacturer’s warranty demonstrates our commitment to quality and dedication to maximizing uptime for your processes or applications. In addition, Applied Rigaku Technologies uses quality materials, and our skilled employees take pride in their craft. If a warranty-related deficiency happens, we are quick to respond. Moreover, warranty plans do not generally extend past a year, making this coverage a testament to the overall excellence of Rigaku EDXRF products.

Benchtop EDXRF for Si Coat Weight Analysis

NEX QC+ Si on Paper

For rapid at-line silicone coat weight analysis, NEX QC Series benchtop analyzers enable the measurement of very low silicone coating weights and metal catalysts in silicone coatings. Challenging applications that were either marginal or impossible with earlier technologies are now a reality.

Furthermore, NEX QC Series analyzers provide QC technicians with an ideal tool for quickly checking silicone coating thickness and composition by simply placing a test coupon in the analysis chamber. Specially designed for routine quality control, the NEX QC Series combine superior performance capabilities with affordability. In addition, the intuitive touchscreen interface and built-in printer make these instruments easy to use and convenient. Automatic sample changer options are also available for high-throughput analysis.

NEX QC Series analyzers help you maintain consistent product quality while keeping inventory costs in balance and minimizing product rejection.

In-line, Real-time Si Coat Weight Profiling

For in-line process control, the NEX LS linear scanner offers real-time cross- and machine-direction Si coat weight profiling of your process. You can quickly identify problems and make immediate quality control decisions for the entire roll as it’s being produced.

NEX LS software is easy to use and provides continuous monitoring and control. Moreover, the intuitive user interface lets you easily define recipes, including scan speeds and sub-second measurement settings, advanced roll reporting, and raw data logging for traceability and audits. You can customize reports, export them as PDF or CSV, and store copies to USB or a network using industry-standard communications protocols. NEX LS offers real-time Si coatings analysis and is an invaluable tool for roll-to-roll (R2R) manufacturing.

Measurements are transmitted to a console box and industrial touchscreen computer as the analytical head sweeps back and forth across a moving web. Real-time data is displayed as a graphical cross-direction and machine-direction profile. You can choose full scanning mode or user-defined fixed analysis positions.

NEX LS Full Scanning Analysis
NEX LS Fixed Analysis Positions

At-line & In-line Solutions for Si Coating Applications

NEX LS – process coatings analyzer for web and coil applications

  • Total solution for silicone release coaters
  • Silicone analysis on paper, clay coated paper, and thin film release liners
  • Proprietary silicone on clay coated paper algorithms
  • Converters – silicone on plastic or paper
  • Vacuum formed plastics – denesting silicone coatings
  • Specialty plastics
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